Microelectronics and Solid State Electronics

Microelectronics and Solid State Electronics is an international peer-reviewed journal. It publishes full research papers, short notes and review articles. The journal is dedicated to advanced engineering methods for micro- and nanofabrication of electronic devices, circuits and systems for electronics, electromechanics, and bioelectronics.


ICV 2015: 74.53; ICV 2016: 81.70
Editor-in-chief: Kamal El-Sankary
p-ISSN: 2324-643X
e-ISSN: 2324-6456

Website: http://journal.sapub.org/msse




Microelectronics and Solid State Electronics

Latest Issue: Volume 7, Number 1 (2019)
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  • Articles
Preface: Special Issue on Emerging Techniques for Nano-Scales CMOS Integrated Circuits Design
Kamal El-Sankary
pp. 0-0
DOI: 10.5923/s.msse.201401   4187 Views  2597 Downloads
This work and the related PDF file are licensed under a Creative Commons Attribution 4.0 International License.
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Guideline on Quantitatively Analyzing Analog Nano-Scale CMOS Circuits Using Ultra-Compact Model
Haoran Yu, Kamal El-Sankary, Ezz El-Masry
pp. 1-8
DOI: 10.5923/s.msse.201401.01   5092 Views  3301 Downloads
This work and the related PDF file are licensed under a Creative Commons Attribution 4.0 International License.
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A 10-Gbps Energy Efficient On-Chip Wireless Communication Network for Multicore Processing
Jean-François Bousquet
pp. 9-16
DOI: 10.5923/s.msse.201401.02   6019 Views  2991 Downloads
This work and the related PDF file are licensed under a Creative Commons Attribution 4.0 International License.
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Analog Integrated Circuit Sizing and Layout Dependent Effects: A Review
Tuotian Liao, Lihong Zhang
pp. 17-29
DOI: 10.5923/s.msse.201401.03   50148 Views  9967 Downloads
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Single-Event Transient Measurement on a DC/DC PWM Controller Using Pulsed X-ray Technique
Y. Ren, L. Chen, S.-T. Shi, G. Guo, R.-F. Feng, S.-J. Wen, R. Wong, N. W. van Vonno, B. L. Bhuva
pp. 30-35
DOI: 10.5923/s.msse.201401.04   6704 Views  3601 Downloads
This work and the related PDF file are licensed under a Creative Commons Attribution 4.0 International License.
  Abstract   References   Full-Text PDF   Full-Text HTML