[1] | S. S. Rathod, A. K. Saxena and S. Dasgupta "Modeling of threshold voltage, mobility, drain current and sub threshold leakage current in virgin and irriadiated SOI FinFET device"J Appl Phys (U.S.A)2010 (accepted) |
[2] | S. K. Vishvakarma, V. Komal. Kumar, A. K. Saxena and S. Dasgupta, "Modeling and Estimation of Edge Direct Tunneling Current for Nanoscale Metal Gate (Hf/AlNx) Symmetric Double Gate MOSFET"Elsevier, Microelectronics Engineering, vol 42, 2011, pp 688-692 |
[3] | Balwinder Raj, Jatin Mitra, Deepak Kumar Bihani, Rangharajan V, A.K. Saxena and S Dasgupta "Process Variation Tolerant FinFET Based Robust Low Power SRAM Cell Design at 32nm Technology" J Low Power Electron (France), vol 7, no 2, April 2011, pp 163-121 |
[4] | Balwinder Raj, A K Saxena and S Dasgupta "Nanoscale FinFET Based SRAM Cell Design:Analysis of Performance metric, Process variation, Underlapped FinFET & Temperature effect"IEEE J Ccts & Syms (USA), vol 11, no 3, June 2011, pp 46-5 |
[5] | S. S. Rathod, A. K. Saxena and S. Dasgupta "Modeling of threshold voltage, mobility, drain current and sub threshold leakage current in virgin and irriadiated SOI FinFET device"J Appl Phys (U.S.A)2010 (accepted) |
[6] | S. K. Vishvakarma, V. Komal Kumar, A. K. Saxena, and S. Dasgupta "Modeling and and Estimation of Band to Band Tunneling Current for Nanoscale Metal Gate (Hf/AlNx) Symmetric Double Gate MOSFET " J Nano & Optoelectron (USA), vol.5, no 3, 2010, pp 340-342 |
[7] | S.S.Rathod, A. K. Saxena and S. Dasgupta "Electrical performance study of 25 nm Ω–Fin FET under the influence of gamma radiation: A 3-D simulation"Microelectron J (U.K), 2010, pp 165-172 |