International Journal of Probability and Statistics

International Journal of Probability and Statistics aims to publish refereed, well-written original research articles, and studies that describe the latest research and developments in the area of probability and statistics, and to provide a platform for scientists and academicians all over the world to promote, share, and discuss various new issues and developments in the area of Probability and Statistics.

David Han

Editorial Board Member of International Journal of Probability and Statistics

Assistant Professor, University of Texas at San Antonio, USA

Research Areas

Reliability Theory and Survival Analysis with Applications in Health and Medicine, Accelerated Life Testing, Competing Risk Analysis, Analysis of Censored Data, Nonparametric Inference, Optimal Censoring Designs and Optimal Sampling Plans


2006-2008Ph.DMcMaster University, Hamilton
2004-2006M.ScMcMaster University, Hamilton
1998-2004B.ScMcMaster University, Hamilton


2009-presentUniversity of Texas San Antonio, Tx,Department of Management Science & Statistics,Assistant Professor of Statistics
1999-2007Mcmaster University Department of Math & Stats Hamilton, Sessional Lecturer

Academic Achievement

NSERC Postdoctoral Fellowships (PDF) 2008-2010-declined
NSERC Post Graduate Scholarship (PGS D3) 2006-2009
NSERC Canada Graduate Scholarship (CGS M) 2005-2006
Ontario Graduate Scholarship (OGS) 2004-2007
Departmental Graduate Research Scholarship
KCSF Annual Scholarship for academic excellence and community leadership
OKBA Annual Scholarship for overall academic excellence
NPCDS Workshop Travel Scholarship and P.V.N.H. Canada Ltd. Professional Training Scholarship
NSERC Undergraduate Student Research Awards (USRA) 2004
The Dr. Harry Lyman Hooker Scholarship for exceptional academic standing
The Retail Services Institute Rothmans Scholarship
McMaster University Faculty of Science Scholarship
McMaster University Murray Ball Entrance Scholarship and Merit Award
CIC-McMaster University Joint Partnership Scholarship for exceptional academic standing
University of Toronto Entrance Scholarship-declined
Governor General's Medal awarded to Top School Graduate
Principal's Scholarship and Award for Top School Graduate


American Statistical Association (ASA)
Institute of Mathematical Statistics (IMS)-Lifetime Member
Korean Statistical Society (KSS)
International Indian Statistical Association (IISA)
Institute for Operations Research and Management Sciences (INFORMS)

Publications: Conferences/Workshops/Symposiums/Journals/Books

[1]  Han, D. and Balakrishnan, N. (2011). "Inference for a simple step-stress model with competing risks for failure from the exponential distribution under time constraint," Computational Statistics and Data Analysis (in print-DOI: 10.1016/j.csda.2010.03.015).
[2]  Balakrishnan, N., Han, D. and Iliopoulos, G. (2011). "Exact inference for progressively Type-I censored exponential failure data," Metrika, 73: 335-358.
[3]  Balakrishnan, N. and Han, D. (2009). "Optimal step-stress testing for progressively Type-I censored data from exponential distribution," Journal of Statistical Planning and Inference, 139: 1782-1798.
[4]  Balakrishnan, N., Xie, Q. and Han, D. (2009). "Exact inference and optimal censoring scheme for a simple step-stress model under progressive Type-II censoring," in: Arnold, B.C., Balakrishnan, N., Sarabia, J.M., Minguez, R. (Eds.), Statistics for Industry and Technology-Advances in Mathematical and Statistical Modeling. Birkhäuser [ISBN: 978-0-8176-4625-7].
[5]  Balakrishnan, N. and Han, D. (2008). "Exact inference for a simple step-stress model with competing risks for failure from exponential distribution under Type-II censoring," Journal of Statistical Planning and Inference, 138: 4172-4186.
[6]  Balakrishnan, N. and Han, D. (2007). "Optimal progressive Type-II censoring schemes for nonparametric confidence intervals of quantiles," Communications in Statistics-Simulation and Computation, 36: 1247-1262.
[7]  Han, D., Balakrishnan, N., Sen, A. and Gouno, E. (2006). "Corrections on Optimal step-stress test under progressive Type-I censoring," IEEE Transactions on Reliability, 55: 613-614.