[1] | V.I.Talanin, I.E.Talanin, D.I.Levinson. Physics of the formation of microdefects in dislocation-free monocrystals of float-zone silicon//Semicond. Sci. & Technol. Vol. 17 (2002). 104. |
[2] | V.I.Talanin, I.E.Talanin, D.I.Levinson. Physical model of paths of microdefects nucleation in dislocation-free single crystals float-zone silicon//Cryst. Res. & Technol. Vol. 37 (2002). 983. |
[3] | V.I.Talanin, I.E.Talanin. Physical nature of grown-in microdefects in Czochralski-grown silicon and their transformation during various technological effects//Phys. Stat. Sol. (a). Vol. 200 (2003). 297. |
[4] | V.I.Talanin, I.E.Talanin. Classification of microdefects in semiconducting silicon//Semicond. Phys., Quantum Electronics & Optoelecrtronics. Vol. 6 (2003). 431. |
[5] | V.I.Talanin, I.E.Talanin. Nucleation, growth and transformation of microdefects in FZ-Si//Semicond. Phys., Quantum Electronics & Optoelecrtronics. Vol. 7 (2004) 16. |
[6] | V.I.Talanin, I.E.Talanin, D.I.Levinson. Formation of microdefects in semiconductor silicon//Crystallography Reports. Vol. 49 (2004). 188. |
[7] | V.I.Talanin, I.E.Talanin. Mechanism of formation and physical classification of the grown-in microdefects in semiconductor silicon//Defect & Diffusion Forum. Vol. 230-232 (2004). 177. |
[8] | V.I.Talanin, I.E.Talanin, S.A. Koryagin, M.Yu. Semikina. Modeling vacancy microvoids formation in dislocation-free silicon single crystals//Semicond. Phys., Quantum Electronics & Optoelecrtronics. Vol. 9 (2006). 77. |
[9] | V.I.Talanin, I.E.Talanin. Formation of grown-in microdefects in dislocation-free silicon monocrystals//In: New Research on Semiconductors/Ed. T.B.Elliot. (Nova Sci. Publ., 2006, New York). Р. 31-68. |
[10] | V.I.Talanin, I.E.Talanin. On the recombination of intrinsic point defects in dislocation-free silicon single crystals//Physics of the Solid State. Vol. 49 (2007). 467. |
[11] | V.I.Talanin, I.E.Talanin, A.A.Voronin. About the simulation of primary grown-in microdefects in dislocation-free silicon single crystals formation//Canadian Journal of Physics. Vol. 85 (2007). 1459. |
[12] | V.I.Talanin. The modeling and properties of dislocation-free silicon single crystals defect structure. (HU "ZISMG", 2007, Zaporozhye) 275 p. (On Russian). |
[13] | V.I.Talanin, I.E.Talanin. Modelling of the defect structure in dislocation-free silicon single crystals//Crystallography Reports. Vol. 53 (2008). 1124. |
[14] | V.I.Talanin, I.E.Talanin, A.I.Mazurskii, M.L.Maximchuk. The development of software for the calculation of dislocation-free silicon monocrystals grown-in defect structure//In: Algorithms & Programs for the Research of Physical Processes in Solid State/Ed. A.N.Gorban. (CPU, 2009, Zaporozhye). P. 67-114. (On Russian). |
[15] | V.I.Talanin, I.E.Talanin. Modelling of defect formation processes in dislocation-free silicon single crystals//Crystallography Reports. Vol. 55 (2010). 632. |
[16] | V.I.Talanin, I.E.Talanin. Kinetics of formation of vacancy microvoids and interstitial dislocation loops in dislocation-free silicon single crystals//Physics of the Solid State. Vol. 52 (2010). 1880. |
[17] | V.I.Talanin, I.E.Talanin. Kinetics of high-temperature precipitation in dislocation-free silicon single crystals//Physics of the Solid State. Vol. 52 (2010). 2063. |
[18] | V.I.Talanin, I.E.Talanin. Kinetic model of growth and coalescence of oxygen and carbon precipitates during cooling of as-grown silicon crystals//Physics of the Solid State. Vol. 53 (2011). 119. |
[19] | V.I.Talanin, I.E.Talanin, N.Ph.Ustimenko. A new method for research of grown-in microdefects in dislocation-free silicon single crystals//Journal of Crystallization Process and Technology. Vol. 1 (2011). 13. |
[20] | V.I.Talanin, I.E.Talanin. A kinetic model of the formation and growth of interstitial dislocation loops in dislocation-free silicon single crystals // J. Crystal Growth. Vol. 346 (2012). 45. |
[21] | V.I.Talanin, I.E.Talanin. The diffusion model of grown-in microdefects formation during crystallization of dislocation-free silicon single crystals // In: Advances in Crystallization Processes / Ed. Y. Mastai. (INTECH Publ., 2012, Rijeka). P. 611-632 |